抄録
We observed the surface and electronic structure of single-crystal LaO0.5F0.5BiSe2 by scanning tunneling microscopy= spectroscopy at 4.2 K. A square lattice composed of Bi atoms was observed at a positive sample bias voltage for the surface prepared by cleavage. At a negative sample bias voltage, a stripe structure along the Bi-Bi directions was observed as in a previous report on NdO0.7F0.3BiS2. Furthermore, we observed a supermodulation along the diagonal directions with a period of about five times the lattice constant. This seems to be indicative of the structural instability of this system rather than the electronic instability attributed to a nesting picture.
本文言語 | 英語 |
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論文番号 | 113701 |
ジャーナル | Journal of the Physical Society of Japan |
巻 | 86 |
号 | 11 |
DOI | |
出版ステータス | 出版済み - 15 11月 2017 |
外部発表 | はい |