TY - GEN
T1 - Read/write operation of spin-based MOSFET using highly spin-polarized ferromagnet/MgO tunnel barrier for reconfigurable logic devices
AU - Marukame, Takao
AU - Inokuchi, Tomoaki
AU - Ishikawa, Mizue
AU - Sugiyama, Hideyuki
AU - Saito, Yoshiaki
PY - 2009
Y1 - 2009
N2 - For future high-performance reconfigurable logic devices, we developed a novel spin-based MOSFET; "Spin-Transfer-Torque-Switching MOSFET (STS-MOSFET)" that enables the read/write performance and memorization of the configuration with nonvolatility by using the ferromagnetic electrodes and the spin-polarized current through Si channel and spin-transfer torque switching in magnetic tunnel junctions (MTJs) on the source/drain. The read/write operation of the STS-MOSFET was first demonstrated in this work. The highly spin-polarized ferromagnet/MgO tunnel barrier electrodes and the MTJs using their structure for the source/drain showed great possibility to realize our proposed STS-MOSFET and to enhance their performance.
AB - For future high-performance reconfigurable logic devices, we developed a novel spin-based MOSFET; "Spin-Transfer-Torque-Switching MOSFET (STS-MOSFET)" that enables the read/write performance and memorization of the configuration with nonvolatility by using the ferromagnetic electrodes and the spin-polarized current through Si channel and spin-transfer torque switching in magnetic tunnel junctions (MTJs) on the source/drain. The read/write operation of the STS-MOSFET was first demonstrated in this work. The highly spin-polarized ferromagnet/MgO tunnel barrier electrodes and the MTJs using their structure for the source/drain showed great possibility to realize our proposed STS-MOSFET and to enhance their performance.
UR - http://www.scopus.com/inward/record.url?scp=77952329486&partnerID=8YFLogxK
U2 - 10.1109/IEDM.2009.5424385
DO - 10.1109/IEDM.2009.5424385
M3 - Conference contribution
AN - SCOPUS:77952329486
SN - 9781424456406
T3 - Technical Digest - International Electron Devices Meeting, IEDM
SP - 9.2.1-9.2.4
BT - 2009 International Electron Devices Meeting, IEDM 2009 - Technical Digest
T2 - 2009 International Electron Devices Meeting, IEDM 2009
Y2 - 7 December 2009 through 9 December 2009
ER -