TY - JOUR
T1 - "Checkerboard stripe" electronic state on cleaved surface of NdO0.7F0.3BiS2 probed by scanning tunneling microscopy
AU - Machida, Tadashi
AU - Fujisawa, Yuita
AU - Nagao, Masanori
AU - Demura, Satoshi
AU - Deguchi, Keita
AU - Mizuguchi, Yoshikazu
AU - Takano, Yoshihiko
AU - Sakata, Hideaki
N1 - Publisher Copyright:
Copyright © 2014 The Physical Society of Japan.
PY - 2014/11/15
Y1 - 2014/11/15
N2 - We present scanning tunneling microscopy measurements on a cleaved surface of the recently discovered superconductor NdO0.7F0.3BiS2 with a transition temperature (Tc) of 5.1 K. Tunneling spectra at 4.2K (below Tc) and 22K (above Tc) show a large spectroscopic gap (∼40 mV), which is inconsistent with the metallic nature demonstrated in bulk measurements. Moreover, we find two interesting real-space electronic features. The first feature is a "checkerboard stripe" electronic state characterized by an alternating arrangement of two types of nanocluster. In one cluster, one-dimensional electronic stripes run along one Bi-Bi direction, whereas, in the other cluster, the stripes run along the other Bi Bi direction. The second feature is a nanoscale electronic inhomogeneity whose microscopic source seems to be atomic defects on the cleaved surface or dopant F atoms.
AB - We present scanning tunneling microscopy measurements on a cleaved surface of the recently discovered superconductor NdO0.7F0.3BiS2 with a transition temperature (Tc) of 5.1 K. Tunneling spectra at 4.2K (below Tc) and 22K (above Tc) show a large spectroscopic gap (∼40 mV), which is inconsistent with the metallic nature demonstrated in bulk measurements. Moreover, we find two interesting real-space electronic features. The first feature is a "checkerboard stripe" electronic state characterized by an alternating arrangement of two types of nanocluster. In one cluster, one-dimensional electronic stripes run along one Bi-Bi direction, whereas, in the other cluster, the stripes run along the other Bi Bi direction. The second feature is a nanoscale electronic inhomogeneity whose microscopic source seems to be atomic defects on the cleaved surface or dopant F atoms.
UR - http://www.scopus.com/inward/record.url?scp=84919689347&partnerID=8YFLogxK
U2 - 10.7566/JPSJ.83.113701
DO - 10.7566/JPSJ.83.113701
M3 - Article
AN - SCOPUS:84919689347
SN - 0031-9015
VL - 83
JO - Journal of the Physical Society of Japan
JF - Journal of the Physical Society of Japan
IS - 11
M1 - 113701
ER -